Design-for-Test News - Week 3, March 2007

Here's a wrap up of some news items that have come across my desk this week. If you want to explore some 'off-the-beaten-track' issues regarding DFT - go to DFT Digest, my main blog.

IEEE P1581 working group publishes new white paper
The IEEE P1581 working group is defining a low overhead design-for-test (DFT) methodology to be implemented in memory devices for the support of board- and system-level connectivity test.

Synopsys TetraMAX Diagnostics for Rapid Yield Learning Adopted By UMC
TetraMAX Diagnostics Now Key Ingredient of Yield Learning Systems for Nanometer Processes

Teradyne Introduces the J750Ex: the Next-Generation of Low-Cost Test
Teradyne, Inc., a world leader in high efficiency, low-cost test, will unveil and demonstrate for the first time the new J750Ex(TM) that delivers a step function improvement in throughput and test economics.

LogicVision Expands Presence in Japan with the Addition of Noah Corporation as Distributor in Japan
LogicVision, Inc., a leading provider of test and yield learning capabilities,
today announced the addition of Noah Corporation as distributor for LogicVision products in Japan.