A couple more press releases for Day 3 of the International Test Conference (ITC). Today the technical program starts (yesterday and Sunday were filled with day-long tutorials). Go to the main DFT Digest site for some insight into what's happening, or add your two cents at the DFT Forum!
G2 Microsystems Innovates With Cadence Low-Power Solution for Faster Development of Wireless Devices
Aehr Test Systems Announces FOX-15(TM) Full Wafer Contact Test and Burn-In System
ASSET® Expands Next-Generation Embedded Instrumentation
Cadence Test Technology Helps LSI Corporation, Kawasaki Microelectronics Deliver Products Faster
Cadence Encounter Test Helps Enable IBM To Deliver High-volume Chips
Genesys Testware Adds Automated Batch-mode Diagnosis and Characterization of Embedded Memories
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