The International Test Conference is now recent history - but here are a few related news items and press releases that have come out in the past week. For discussion and/or analysis, please visit DFT Digest or DFT Forum!
Intellitech Offers New Concurrent JTAG Test Platform for PCBs with ARM Based Processors
Panel explores the expanded role of test in DFM
Intel VP at ITC calls for test development advances to meet challenges of next-gen SoC
The Last Bastion II : Some Q&A with DeFacto President and CTO Dr. Chouki Aktouf
ATPG Tool Meets Growing Demand For Scan Test Compression
TI fellow defines conditions and requirements for adaptive test at ITC
LogicVision Common Stock Transferred to the Nasdaq Capital Market
LogicVision Reports Third Quarter 2007 Financial Results
DFT Microsystems Bolsters Executive Team
Synopsys Customers Accelerate Yield Learning With Converged Test and Yield Management Data Flow
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