A smattering of press releases and such for the last couple of months:
Westinghouse Rail Systems selects XJTAG boundary scan system to verify prototype integrity
Mentor Graphics Chairman and CEO to Present Keynote at International System-on-Chip Design Conference
Mentor's TestKompress reaches out to 45-nm
Mentor Graphics Announces TestKompress Xpress Technology to Address Manufacturing Test Requirements for 65 and 45 Nanometer Integrated Circuits
LogicVision Announces That Q3 2007 Cash Exceeds Guidance
Goepel’s Puri on North American restructuring
Dr. Jacob Abraham receives Best Paper Award at international conference
Global Unichip Adopts Synopsys Test Solution to Achieve Higher SoC Test Quality
Strategic Alliance Between GOEPEL Electronic And Testonica Lab
LogicVision Provides Desktop Silicon Characterization and Diagnostics Solution with the Introduction of Silicon Insight
Perform Design-for-Test and Power Management at the RTL
New Digital I/O Scan Test Module Provides Flexibility
International Test Conference -- The Cornerstone of Test Week(TM) Holds 38th Conference in Santa Clara, California, October 23-25, 2007
ITC tackles nanometer test challenges
Synopsys Lowers the Cost of Semiconductor Testing at Tessolve
Cost-Effective, Ultra-High-Quality Test Results Using Synopsys DFT MAX Achieved at SHARP
ARM Selects XJTAG For RealView Development Tools Debug And Test
LogicVision Announces New Release of Its Embedded SerDes Test Solution
SynTest granted 6 more Patents since October 2006
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