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DFT Digest

Monday, October 22, 2007

ITC Monday news...

Posting these as they come up...

DeFacTo Unveils New Design for Test Product that Eliminates Need for Gate-level Scan; Creates Industry’s First High-level DFT Sign-off Methodology

Synopsys Advances Low Power Management for Manufacturing Test

Synopsys Improves the Quality of Manufacturing Tests with Timing-Aware Pattern Generation
Posted by John at 2:48 PM

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John
Orange County, California, United States
I'm author of DFT Digest - a blog about Design-for-Test of electronic devices and such.
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      • International Test Conference Begins!
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